Feature Selection using a Mutual Information Based Measure
| Contribuinte(s) |
Kasturi, R Laurendeau, D Suen, C |
|---|---|
| Data(s) |
2002
|
| Identificador | |
| Publicador |
Institute of Electrical and Electronics Engineers |
| Relação |
Al-Ani, Ahmed & Deriche, Mohamed (2002) Feature Selection using a Mutual Information Based Measure. In Kasturi, R, Laurendeau, D, & Suen, C (Eds.) Proceedings of the 16th International Conference on Pattern Recognition, 11 - 15 August 2002, Quebec City, Canada. |
| Fonte |
Faculty of Built Environment and Engineering |
| Tipo |
Conference Paper |
